ECON provides a powerful series of instruments specializing in shock measurement and analysis. It is a tailored solution for transient shock pulses capture and analysis according to rigorous criteria of both ISO and MIL-STD-810. More important, it provides to you observations to physical attributes of tested objects through effective SRS analysis.
Features
• Compatible with ISO, MIL-STD-810 criteria
• Sampling rate up to 1MHz
• Acceleration range up to 100,000 gn
• Pulse width as low as 0.1ms
• Support external triggering
• Support external triggering
Specifications
| Type | MI-5201/02 | MI-5104/08 |
| Input channel | 1~2 voltage inputs with 1~2 charge inputs(built-in charge amplifier) | 4~8 voltage inputs |
| Output channel | 1 voltage outputs | |
| Sampling Frequency | up to 192kHz | up to 1MHz |
| Voltage Range | ±10VPEAK | |
| Coupling Mode | Voltage, ICP, charge(2 channels optional) | Voltage, ICP |
| ADC resolution | 24-bit | 16-bit |
| Pulse Duration | 0.5-1000ms | 0.1-1000ms |
| Acceleration Range | 20,000gn | 100,000gn |
| Dynamic Range | 110dB | 80dB |
| THD | <-95dB | <-70dB |
| Signal-to-Noise | >95dB | >70dB |
| Frequency Accuracy | 0.01% | |
Transient shock waveform capture
You can acquire single or multi pulse and the system automati-cally analyze its peak value, pulse width, and velocity change etc. Then match it with actual wave and compare the deviation of them
Shock Response Spectrum Analysis
System can evaluate potential injury caused by pulse and provide impact resistance evidences for designing products, and also, it can do SRS analysis for each pulse and compare the deviation of real SRS and object SRS.
Others
Force deformation analysis, pulse response demo, rotation pulse analysis, etc. Force deformation analysis can calculate force peak value, deformation peak value, energy and efficiency etc. Pulse response demo is used for studying shock response spectrum, rotation pulse analysis control rotating pulse machine or other rotating machines, the signal can be calculated by axial acceleration.
